XPS

 

   

Model : PHI 5000 VersaprobeⅡ

Key parameters :

Micro-Focused Monochromatic Al Kα X-ray Source

Scanning X-ray Beam Induced Secondary Electron Image (SXI)

5 Axis Motor Sample Stage: TOA range from 0~90o for angle-resolved analysis, variable angular accuracy better than 1o

 

Dual Beam Charge Neutralization Systerm

Gas Cluster Ion Gun (GCIB)

UltraViolet Photoelectron Spectroscopy (UPS)